multimode 8 model atomic force microscope (afm) Search Results


atomic force microscopy  (Bruker Corporation)
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Bruker Corporation atomic force microscopy
Atomic Force Microscopy, supplied by Bruker Corporation, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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scanning probe microscopy system dimension icon  (Bruker Corporation)
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Bruker Corporation scanning probe microscopy system dimension icon
Scanning Probe Microscopy System Dimension Icon, supplied by Bruker Corporation, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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atomic force microscope  (Bruker Corporation)
90
Bruker Corporation atomic force microscope
Atomic Force Microscope, supplied by Bruker Corporation, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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spm system bruker multimode 8  (Bruker Corporation)
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Bruker Corporation spm system bruker multimode 8
Spm System Bruker Multimode 8, supplied by Bruker Corporation, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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a multimode 8 atomic force microscope  (Veeco)
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Veeco a multimode 8 atomic force microscope
A Multimode 8 Atomic Force Microscope, supplied by Veeco, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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multimode 8 version  (Bruker Corporation)
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Bruker Corporation multimode 8 version
Multimode 8 Version, supplied by Bruker Corporation, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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microscope bruker multimode 8 with scanasyst  (Bruker Corporation)
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Bruker Corporation microscope bruker multimode 8 with scanasyst
Microscope Bruker Multimode 8 With Scanasyst, supplied by Bruker Corporation, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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conductive atomic force microscopy c-afm multimode 8  (Bruker Corporation)
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Bruker Corporation conductive atomic force microscopy c-afm multimode 8
( a ) Top-view SEM and ( b ) AFM images (scale: 5 × 5 µm) of ITIC, IT-4f, and COi8DFIC films coated on the ITO/NiO x /perovskite layer. ( c ) Schematic energy level diagram of the perovskite and non-fullerene ETMs. ( d ) Series resistance (Rs) calculated from the J–V curve of the device manufactured under optimal concentration conditions. ( e ) <t>C-AFM</t> images (scale: 2 × 2 µm) of ITIC, IT-4f, and COi8DFIC films.
Conductive Atomic Force Microscopy C Afm Multimode 8, supplied by Bruker Corporation, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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multimode 8 microscope  (Bruker Corporation)
90
Bruker Corporation multimode 8 microscope
( a ) Top-view SEM and ( b ) AFM images (scale: 5 × 5 µm) of ITIC, IT-4f, and COi8DFIC films coated on the ITO/NiO x /perovskite layer. ( c ) Schematic energy level diagram of the perovskite and non-fullerene ETMs. ( d ) Series resistance (Rs) calculated from the J–V curve of the device manufactured under optimal concentration conditions. ( e ) <t>C-AFM</t> images (scale: 2 × 2 µm) of ITIC, IT-4f, and COi8DFIC films.
Multimode 8 Microscope, supplied by Bruker Corporation, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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multimode microscope bruker multimode 8  (Bruker Corporation)
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Bruker Corporation multimode microscope bruker multimode 8
( a ) Top-view SEM and ( b ) AFM images (scale: 5 × 5 µm) of ITIC, IT-4f, and COi8DFIC films coated on the ITO/NiO x /perovskite layer. ( c ) Schematic energy level diagram of the perovskite and non-fullerene ETMs. ( d ) Series resistance (Rs) calculated from the J–V curve of the device manufactured under optimal concentration conditions. ( e ) <t>C-AFM</t> images (scale: 2 × 2 µm) of ITIC, IT-4f, and COi8DFIC films.
Multimode Microscope Bruker Multimode 8, supplied by Bruker Corporation, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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scanning probe microscope bruker multimode 8  (Bruker Corporation)
90
Bruker Corporation scanning probe microscope bruker multimode 8
( a ) Top-view SEM and ( b ) AFM images (scale: 5 × 5 µm) of ITIC, IT-4f, and COi8DFIC films coated on the ITO/NiO x /perovskite layer. ( c ) Schematic energy level diagram of the perovskite and non-fullerene ETMs. ( d ) Series resistance (Rs) calculated from the J–V curve of the device manufactured under optimal concentration conditions. ( e ) <t>C-AFM</t> images (scale: 2 × 2 µm) of ITIC, IT-4f, and COi8DFIC films.
Scanning Probe Microscope Bruker Multimode 8, supplied by Bruker Corporation, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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afm bruker multimode 8  (Bruker Corporation)
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Bruker Corporation afm bruker multimode 8
( a ) Top-view SEM and ( b ) AFM images (scale: 5 × 5 µm) of ITIC, IT-4f, and COi8DFIC films coated on the ITO/NiO x /perovskite layer. ( c ) Schematic energy level diagram of the perovskite and non-fullerene ETMs. ( d ) Series resistance (Rs) calculated from the J–V curve of the device manufactured under optimal concentration conditions. ( e ) <t>C-AFM</t> images (scale: 2 × 2 µm) of ITIC, IT-4f, and COi8DFIC films.
Afm Bruker Multimode 8, supplied by Bruker Corporation, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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Image Search Results


( a ) Top-view SEM and ( b ) AFM images (scale: 5 × 5 µm) of ITIC, IT-4f, and COi8DFIC films coated on the ITO/NiO x /perovskite layer. ( c ) Schematic energy level diagram of the perovskite and non-fullerene ETMs. ( d ) Series resistance (Rs) calculated from the J–V curve of the device manufactured under optimal concentration conditions. ( e ) C-AFM images (scale: 2 × 2 µm) of ITIC, IT-4f, and COi8DFIC films.

Journal: Nanomaterials

Article Title: Non-Fullerene Small Molecule Electron-Transporting Materials for Efficient p-i-n Perovskite Solar Cells

doi: 10.3390/nano10061082

Figure Lengend Snippet: ( a ) Top-view SEM and ( b ) AFM images (scale: 5 × 5 µm) of ITIC, IT-4f, and COi8DFIC films coated on the ITO/NiO x /perovskite layer. ( c ) Schematic energy level diagram of the perovskite and non-fullerene ETMs. ( d ) Series resistance (Rs) calculated from the J–V curve of the device manufactured under optimal concentration conditions. ( e ) C-AFM images (scale: 2 × 2 µm) of ITIC, IT-4f, and COi8DFIC films.

Article Snippet: The properties of film were examined by looking at surface images while checking its properties and work function using atomic force microscopy (AFM, XE7, Park System, Suwon, Korea), field emission scanning electron microscopy (FE-SEM, JSM-7100F, JEOL Ltd., Tokyo, Japan), ultraviolet photoelectron spectroscopy (UPS, Nexsa-XPS system, Thermo Scientific Ltd., Waltham MA, USA) with He I (21.2 eV) as the photon source, and conductive atomic force microscopy (C-AFM, Bruker, Billerica, MA, USA, MultiMode 8).

Techniques: Concentration Assay